Bendable conductive connector

ABSTRACT

A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral with said second end. The test point connector is for making electrical contact with testing points. The present invention may be part of a probing system. The present invention may also include a method for using the conductive connector.

The present application is a continuation of U.S. patent applicationSer. No. 11/019,325, filed Dec. 17, 2004, now U.S. Pat. No. 7,221,179.U.S. patent application Ser. No. 11/019,325 is an application claimingthe benefit under 35 USC Section 119(e) of U.S. Provisional PatentApplication Ser. No. 60/531,078, filed Dec. 18, 2003. The presentapplication is based on and claims priority from these applications, thedisclosures of which are hereby expressly incorporated herein byreference.

BACKGROUND OF INVENTION

The present invention relates to an electrical test probe tip (“probingtip”), and more particularly to a bendable conductive connector.

FIGS. 1 and 2 show a probing system that includes an electrical testprobe 20 for providing an electrical connection between electricalcomponents 22 and testing instruments 24. An electrical test probe 20generally consists of a cable 32 having a probing head 30 at one end anda testing instrument connector 34 at the other end for attaching thecable to testing instruments 24 (e.g. oscilloscopes and other measuring,monitoring, diagnostic, and signal processing instruments). The probinghead 30 generally is interconnectable with at least one probing tip,which may be a removable and/or replaceable probing tip 40. A socket 38or other connection means may be used for connecting the probing tip 40to the probing head 30. One or more of the probing tips 40 may be used,for example, for making electrical contact with testing points 22 (e.g.pins, leads, paths, or other electrical components) such as those foundon a circuit board. One or more of the probing tips 40 may be used as ameans for connecting the probing head 30 to ground. Ground provides theelectrical reference point for other signal measurements, so the groundconnection typically remains unchanged while the probing head ispositioned at testing points so that the electrical signal thereon maybe measured, monitored, or otherwise processed.

It is difficult to form a contact with modern miniaturized testingpoints. For example, both the pins and the spacing between the pins on amodern integrated circuit chip (“IC”) have been miniaturized. If twoadjacent pins are contacted simultaneously by the probing tip, a shortcircuit may result between the two adjacent pins. A short circuit mayprevent measurement of the desired signal and may result in damage tothe internal circuitry of the IC.

Most probing tips are stiff. For example, a traditional probing tip is astiff conductive member that terminates in a conical, blunt, or roundedpoint. IC grabber probes have a jaw-like tip that connects to and holdsa pin, but are also relatively stiff and prevent optimum positioning ofprobing heads.

Tektronix, Inc. produces a signal-ground adapter that has beenspecifically designed to connect with a square pin. But like the ICgrabber probes, the signal-ground adapter connects rigidly to signal andground pins, and the inflexibility prevents desirable movement of theprobing head to optimum positions. Tektronix also produces a right-angleadapter that includes a stiff coil used to rigidly attach a probe at aright angle to a pin. The purpose of the stiff coil is to mate with apin, and the stiffness prevents movement of the probe. Because it isinflexible after mating with the pin, the coil is not adaptable and maybe used in only one position for probing a specific type of pin (a 0.025inch diameter square pin). Tektronix also produces a “Y-lead” adapterthat has wire leads that may be combined with the right-angle adapter.The combination of the right-angle adapter and the Y-lead adapter mayallow the probing head to be moved relative to the device being probed,but the addition of leads may add inductance. Probing an electricaldevice using the Y-lead adapter may be inconvenient or impossible usingjust one hand. Typically, the probe body must be laid on the table whilepin connections are changed. Draping the wire leads on electricalcomponents and moving parts, such as a CPU fan, is another disadvantageof the Y-lead adapter.

Several prior art references are directed to electrical test probe tipsand electrical connectors. U.S. Pat. No. 4,978,312 to Fodali (the“Fodali reference”) is directed to a tip attachment for a circuit testprobe and, specifically, to a spring attachment for placement on ahandheld tester with an ice pick-type probe. One end of the taperedspring tip attachment fits on the ice pick-type probe, and the other endterminates in a straight length of wire. The purpose of this springattachment is to provide a smaller gauge tip for insertion into socketstoo small for the ice pick probe. In other words, the Fodali tip uses aspring merely as a connector for attaching the straight wire probe endto a tapered ice pick-type probe.

U.S. Pat. No. 3,885,848 to Brouneus (the “Brouneus reference”) isdirected to a method of making an electrical connection with a flatsurface contact using a conical spring. The contact member is aconically spiraled length of electrically conductive resilient wireincluding spirals that progressively increase in size. A cylindricalhelix is electrically connected to the small end of the volute helix. Anelectrically conductive terminal member may be inserted into and securedwithin the cylindrical helix. The wide end of the conical spring may beelectrically connected to a flat conductive surface. Compressing thevolute helix moves the spirals of the helix into contact with a flatsurface. The volute helix would return to its original position if notheld in place.

Problems with exemplary ground connections include, but are not limitedto, that they do not hold themselves in place, they are not able to beused in an axial application, they have poor compliance, they have pooror little radial adjustment, they have poor axial compliance, and theyare not adjustable or are only adjustable in one direction.

BRIEF SUMMARY OF THE INVENTION

One preferred embodiment of the conductive connector of the presentinvention includes a bendable, shape retainable extension having a firstend and a second end. A head connector is integral with the first endand a test point connector is integral with the second end. The headconnector is for connecting the conductive connector to a probing head.The test point connector is for making electrical contact with testingpoints. The present invention may be part of a probing system thatincludes a probing head. The present invention may also include a methodfor using the conductive connector.

Another preferred embodiment of the conductive connector of the presentinvention includes a bendable, shape retainable extension having a firstend and a second end. The first end is integral with the probing head.The test point connector is integral with said second end. The testpoint connector is for making electrical contact with testing points.The present invention may be part of a probing system. The presentinvention may also include a method for using the conductive connector.

The foregoing and other objectives, features, and advantages of theinvention will be more readily understood upon consideration of thefollowing detailed description of the invention, taken in conjunctionwith the accompanying drawings.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 is a schematic diagram of a first exemplary probing system inwhich the bendable conductive connector of the present invention may beused, the test point connector of the bendable conductive connectorbeing in an extended position.

FIG. 2 is a schematic diagram of a second exemplary probing system inwhich the bendable conductive connector of the present invention may beused, the test point connector of the bendable conductive connectorbeing in a retracted position.

FIG. 3 is a perspective view of a bendable conductive connector that isinterconnectable at one end with a probe head and at the opposite endwith an electrical component.

FIG. 4 is a top plan view of a bendable conductive connector in astraight shape.

FIG. 5 is a top plan view of a bendable conductive connector in theprocess of being bent by hand.

FIG. 6 is a top plan view of a long embodiment of a bendable conductiveconnector with two bends therein.

FIG. 7 is a top plan view of a short embodiment of a bendable conductiveconnector with a single bend therein.

FIG. 8 is a cross-sectional view of the test point connector taken alonglines 8′-8′ of FIG. 6.

FIG. 9 is a perspective view of a bendable conductive connector that isintegral at one end with a probe head and interconnectable at theopposite end with an electrical component.

DETAILED DESCRIPTION OF THE INVENTION

As shown in FIGS. 1 and 2 the present invention may be implemented aspart of a probing system that includes an electrical test probe 20 forproviding an electrical connection between electrical components 22 (orground, hereinafter jointly referred to as “testing points 22”) andtesting instruments 24. An electrical test probe 20 generally consistsof a probing head 30, a cable 32, and a testing instrument connector 34.The probing head 30 may have an integral or replaceable bendableconductive connector probe tip 50 that is suitable for making anelectrical contact with electrical components 22. FIGS. 1-8 show areplaceable configuration and FIG. 9 shows an integral configuration.

One or more bendable conductive connector 50 may be used, for example,for making electrical contact with testing points 22. One or morebendable conductive connector 50 may be used as a means for connectingthe probing head 30 to a ground testing point. Ground provides theelectrical reference point for other signal measurements, so the groundconnection typically remains unchanged while the probing head 30 ispositioned at testing points 22 so that the electrical signal thereonmay be measured, monitored, or otherwise processed.

Customers need innovative adjustable spring loaded ground connectorssuch as the bendable conductive connector 50 of the present invention tohold ground leads in place. One advantage of the bendable conductiveconnector 50 of the present invention is that it is able to “snake”around objects.

One preferred embodiment of the bendable conductive connector 50 of thepresent invention includes a three-part bendable conductive connector50: a head connector 52, a bendable extension 54, and a test pointconnector 56.

If the bendable conductive connector probe tip 50 is replaceable,generally the probing head 30 will have a socket 38 or other connectionmechanism for mating with the bendable conductive connector 50. The headconnector 52, as shown, may be for example a square pin or otherconnection mechanism compatible with the socket 38 or other connectionmechanism of a probing head 30 of an electrical test probe 20. As shownin FIG. 9, it should be noted that if the bendable conductive connector50 were integral with the probing head 30, neither the head connector 52nor the socket 38 (or other connection mechanism) would be necessary.

The bendable extension 54 may be any conductive material that isbendable and shape retainable. For purposes of this invention, thebendable extension 54 is not “floppy” in that it is able to hold itsshape once it is shaped in the proper position and shape. For purposesof this invention, the bendable extension 54 is not flexible (which, forpurposes of this invention can be defined as being able to changeshapes, but snapping back or otherwise returning to its original shaperather than holding the new shape). For purposes of this invention, thebendable extension 54 is not truly stiff in that it is able to changeshape relatively easily (e.g. without the use of tools or substantialforce). The bendable extension 54 may optionally include an insulatingjacket 70 (FIG. 8).

The test point connector 56 is generally for making electrical contactwith testing points 22. The test point connector 56, is shown as, forexample, a spring loaded pogo pin. A pogo pin is a kind of spring-loadedpin formed of an inner member 60 (shown as a pin) and an outer member 62joined together with an internal spring 64. In one preferred embodimenta contactor 66 is formed on the end of the inner member 60. A pogo pinis generally used to contact pads on a circuit board. FIG. 1 shows thetest point connector 56 (not labeled) being in an extended position.FIG. 2 shows the test point connector 56 (not labeled) being in aretracted position.

The present invention also includes a method for using the bendableconductive connector 50. The first step of the method is to provide abendable conductive connector 50 that has a bendable extension 54, ahead connector 52, and a test point connector 56. The bendable extension54 has a first end and a second end. The head connector 52 is preferablyintegral with the first end of the bendable extension 54. The test pointconnector 56 is preferably integral with the second end of the bendableextension 54. FIG. 4 shows an exemplary bendable conductive connector ina straight shape. Next, as shown in FIG. 5, a user bends the bendableextension 54 into a desired shape or configuration. Preferably, thebendable extension 54 is hand bendable such that no special tools arerequired for bending it. As the bendable extension 54 is bendable andshape retainable, the bendable extension 54 holds its shape after it isbent. FIG. 6 shows a long embodiment of the bendable conductiveconnector with two bends therein. FIG. 7 shows a short embodiment of thebendable conductive connector with a single bend therein. If thebendable conductive connector is a replaceable embodiment, the headconnector 52 may then be inserted into a socket 38 of a probing head 30.Finally, the test point connector 56 may be used to probe at least onetesting point 22. It should be noted that the term “testing point” caninclude ground.

The terms and expressions that have been employed in the foregoingspecification are used as terms of description and not of limitation,and are not intended to exclude equivalents of the features shown anddescribed or portions of them. The scope of the invention is defined andlimited only by the claims that follow.

1. A conductive connector comprising: (a) a bendable extension able tohold its shape once it is shaped in a proper position and shape, saidbendable extension having a first end and a second end; (b) a probinghead integral with said first end; and (c) a test point connectorintegral with said second end.
 2. The conductive connector of claim 1wherein said bendable extension is shape retainable.
 3. The conductiveconnector of claim 1 wherein said probing head is a probing head of anelectrical test probe.
 4. The conductive connector of claim 1 whereinsaid test point connector is a spring loaded pogo pin.
 5. The conductiveconnector of claim 1 wherein said conductive connector is a groundconductive connector of said probing head.
 6. The conductive connectorof claim 1 wherein said bendable extension is not truly stiff in that itis able to change shape relatively easily.
 7. A probing systemcomprising: (a) a conductive connector comprising: (i) a bendable, shaperetainable extension able to hold its shape once it is shaped in aproper position and shape, said bendable, shape retainable extensionhaving a first end and a second end; and (ii) a test point connectorintegral with said second end; and (b) a probing head of an electricaltest probe, said probing head integral with said first end.
 8. Theprobing system of claim 7 wherein said test point connector is a springloaded pogo pin.
 9. The probing system of claim 7 wherein saidconductive connector is a ground conductive connector of said probinghead.
 10. The probing system of claim 7 wherein said bendable, shaperetainable extension is not truly stiff in that it is able to changeshape relatively easily.
 11. A method for using a conductive connector,said method comprising the steps of: (a) providing a probing head; (b)providing a conductive connector comprising: (i) a bendable, shaperetainable extension able to hold its shape once it is shaped in aproper position and shape, said bendable, shape retainable extensionhaving a first end and a second end; (ii) said probing head integralwith said first end; and (iii) a test point connector integral with saidsecond end; (c) bending said bendable, shape retainable extension into adesired configuration; and (d) using said test point connector, probingat least one testing point.
 12. The method of claim 11 wherein saidbendable, shape retainable extension is not truly stiff in that it isable to change shape relatively easily.
 13. The method of claim 11wherein said test point connector is a spring loaded pogo pin.
 14. Themethod of claim 11 wherein said probing head is a probing head of anelectrical test probe.
 15. The method of claim 11 further comprising thestep of probing at least one ground testing point.